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Reconstruction Strategies for Combined Tilt- and Focal Series Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  23 September 2015

Tim Dahmen ,
Holger Kohr ,
Niels de Jonge  and
Philipp Slusallek
Tim Dahmen
Affiliation:
German Research Center for Artificial Intelligence GmbH (DFKI), 66123 Saarbrucken, Germany
Holger Kohr
Affiliation:
KTH Royal Institute of Technology, Dep. of Mathematics, Lindstedtsvagen 25, Stockholm, SE 100 44
Niels de Jonge
Affiliation:
INM - Leibniz Institute for New Materials, 66123 Saarbrucken, Germany Email of the presenting author: [email protected]
Philipp Slusallek
Affiliation:
German Research Center for Artificial Intelligence GmbH (DFKI), 66123 Saarbrucken, Germany

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2337 - 2338
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Dahmen, T & Kohr, H, N deJonge and P Slusallek. Microsc. Microanal. 20 (2014). pp. 548–560.Google Scholar
[2] Hovden, R, et al, Ultramicroscopy 140 (2014). pp. 26–31.Google Scholar
[3] Dahmen, T, et al "Matched Backprojection Operator for Combined Scanning Transmission Electron Tilt- and Focal Series" under review. Microsc. Microanal. (2015).Google Scholar