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Real-time Multi-Object Tracking of Ion-irradiation Induced Defects in in situ TEM Videos

Published online by Cambridge University Press:  22 July 2022

Rajat Sainju
Affiliation:
Department of Materials Science and Engineering, University of Connecticut, Storrs, CT, USA
Wei-Ying Chen
Affiliation:
Nuclear Science and Engineering Division, Argonne National Laboratory, Lemont, IL, USA
Samuel Schaefer
Affiliation:
Department of Materials Science and Engineering, University of Connecticut, Storrs, CT, USA
Qian Yang
Affiliation:
Department of Computer Science and Engineering, University of Connecticut, Storrs, CT, USA
Caiwen Ding
Affiliation:
Department of Computer Science and Engineering, University of Connecticut, Storrs, CT, USA
Meimei Li
Affiliation:
Nuclear Science and Engineering Division, Argonne National Laboratory, Lemont, IL, USA
Yuanyuan Zhu*
Affiliation:
Department of Materials Science and Engineering, University of Connecticut, Storrs, CT, USA
*
*Corresponding author: [email protected]

Abstract

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Type
Correlative Microscopy and High-Throughput Characterization for Accelerated Development of Materials in Extreme Environments
Copyright
Copyright © Microscopy Society of America 2022

References

Dendorfer, P et al. , International Journal of Computer Vision 129 (2021), p. 845.CrossRefGoogle Scholar
Li, M, Chen, WY and Baldo, PM, Materials Characterization 173 (2021), p. 110905.CrossRefGoogle Scholar