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A Readily-automated Scheme for Estimating the Critical Dose of Beam-Sensitive Materials
Published online by Cambridge University Press: 22 July 2022
Abstract
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- Type
- On Demand - Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-Beam Sample Interactions
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- Copyright
- Copyright © Microscopy Society of America 2022
References
Egerton, R. F. Electron Energy-Loss Spectroscopy in the Electron Microscope. (Springer US, 2011).CrossRefGoogle Scholar
De la Pena, F., Prestat, E., Fauske, V. T., Burdet, P. hyperspy/hyperspy: HyperSpy v1.5.2. (2019).Google Scholar
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