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Rapid Atomic-Resolution Image Analysis: Towards Near-Instant Feedback

Published online by Cambridge University Press:  01 August 2018

Oleg S. Ovchinnikov ,
Andrew O’Hara ,
Sergei V. Kalinin ,
Stephen Jesse ,
Albina Y. Borisevich  and
Sokrates T. Pantelides
Oleg S. Ovchinnikov
Affiliation:
Department of Physics and Astronomy, Vanderbilt University, Nashville, TN, USA Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Andrew O’Hara
Affiliation:
Department of Physics and Astronomy, Vanderbilt University, Nashville, TN, USA
Sergei V. Kalinin
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Stephen Jesse
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Albina Y. Borisevich
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Sokrates T. Pantelides
Affiliation:
Department of Physics and Astronomy, Vanderbilt University, Nashville, TN, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 538 - 539
Copyright
© Microscopy Society of America 2018 

References

[1] Work performed at Vanderbilt was supported in part by Department of Energy grant DE-FG02-09ER46554 (OOS, AOH, STP).This work was performed in part at the Center for Nanophase Materials Sciences, which is supported at Oak Ridge National Laboratory by Scientific User Facilities Division, US DOE. OOS, SJ and SVK were also supported by ORNL’s Labotatory Directed Research and Development Fund. AYB was supported by the Division of the Materials Science and Engineering, US DOE.Google Scholar