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Raman and Infared Microspectroscopy of the High Explosives TNT, PETN, and RDX Heated to their Melting Point and Beyond

Published online by Cambridge University Press:  01 August 2004

Edgar S. Etz  and
Greg Gillen
Edgar S. Etz
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland
Greg Gillen
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 1306 - 1307
Copyright
© 2004 Microscopy Society of America

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