Hostname: page-component-586b7cd67f-dsjbd Total loading time: 0 Render date: 2024-11-26T12:44:59.096Z Has data issue: false hasContentIssue false
  • English
  • Français

Raman and Infared Microspectroscopy of the High Explosives TNT, PETN, and RDX Heated to their Melting Point and Beyond

Published online by Cambridge University Press:  01 August 2004

Edgar S. Etz  and
Greg Gillen
Edgar S. Etz
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland
Greg Gillen
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 1306 - 1307
Copyright
© 2004 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)