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Quick and Correlative TOF-SIMS Analysis of Dispersoid Content in Powder Feedstock and Printed Oxide Dispersion Strengthened Alloys

Published online by Cambridge University Press:  22 July 2022

Laura G. Wilson*
Affiliation:
Materials Science and Engineering Department/Case Western Reserve University, Cleveland, OH, USA
David L. Ellis
Affiliation:
High Temperature and Smart Alloys Branch/NASA Glenn Research Center, Cleveland, OH, USA
Timothy M. Smith
Affiliation:
High Temperature and Smart Alloys Branch/NASA Glenn Research Center, Cleveland, OH, USA
John T. K. Kim
Affiliation:
Swagelok Center for Surface Analysis of Materials, School of Engineering/Case Western Reserve University, Cleveland, OH, USA
Jennifer. L. W. Carter
Affiliation:
Materials Science and Engineering Department/Case Western Reserve University, Cleveland, OH, USA
*
*Corresponding author: [email protected]

Abstract

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Type
Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens
Copyright
Copyright © Microscopy Society of America 2022

References

Ault, G. M. and Burte, H. M., Proceedings of Metallurgical Society Conference, Vol. 47: Oxide Dispersion Strengthening (1966), p. 3-57.Google Scholar
Lewandowski, J. J. and Seifi, M., Annual Review of Materials Research vol. 46, no. 1 (July 2016), p. 151-186. doi: 10.1146/annurev-matsci-070115-032024.CrossRefGoogle Scholar
Ansell, G. S., Proceedings of Metallurgical Society Conference, Vol. 47: Oxide Dispersion Strengthening (1966), p. 61-141.Google Scholar
Bearden, J. A., Reviews of Modern Physics vol. 39, no. 1 (January 1967), p 78-124. doi: 10.1103/RevModPhys.39.78.CrossRefGoogle Scholar
Handbook of Auger Electron Spectroscopy”, ed. Childs, K. D. et al. , (Physical Electronics, Eden Prairie, MN, 1995).Google Scholar
Handbook of X-Ray Photoelectron Spectroscopy”, ed. Moulder, J. F. et al. , (Physical Electronics, Eden Prairie, MN, 1995).Google Scholar
“Atomic Weights and Isotopic Compositions for All Elements.” https://physics.nist.gov/cgi-bin/Compositions/stand_alone.pl (accessed Jan. 27, 2022).Google Scholar
Smith, T. M., et al. , Scientific Reports vol. 10 (2020), p. 9663. doi: 10.1038/s41598-020-66436-5CrossRefGoogle Scholar
The work was funded by NASA NSSC grant 18K1737. TOF-SIMS was conducted at the Case School of Engineering, Swagelok Center for Surface Analysis of Materials (SCSAM). Financial assistance for instrument time and scientific training was provided by the SCSAM Fellowship program which is supported by The Swagelok(R) Center for Surface Analysis of Materials Endowment Fund.Google Scholar