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Quest for an Optical Circuit Probe

Published online by Cambridge University Press:  23 September 2015

Jun Xu ,
Anshuman Kumar ,
Kin Hung Fung ,
Dafei Jin  and
Nicholas X. Fang
Jun Xu
Affiliation:
Dept of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge, USA
Anshuman Kumar
Affiliation:
Dept of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge, USA
Kin Hung Fung
Affiliation:
Dept of Applied Physics, The Hong Kong Polytechnic University, Hong Kong
Dafei Jin
Affiliation:
Dept of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge, USA
Nicholas X. Fang
Affiliation:
Dept of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1251 - 1252
Copyright
Copyright © Microscopy Society of America 2015 

References

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[2] Bergman, D. J. & Stockman, M. I., Phys. Rev. Lett. 90, 027402 (2003).CrossRefGoogle Scholar
[3] Chaturvedi, P., et al., ACS Nano 3, 2965–2974 (2009).CrossRefGoogle Scholar
[4] Markel, V. A., J. Opt. Soc. Am. B 12, 1783–1791 (1995).Google Scholar
[5] Fung, K. H., et al, Phys Rev. B 89, 045408 (2014).Google Scholar
[6] The authors acknowledge the financial support by the NSF (grant CMMI-1120724) and AFOSR MURI (Award No. FA9550-12-1-0488). K.H.F. acknowledges financial support from Hong Kong RGC grant 509813.Google Scholar