Hostname: page-component-586b7cd67f-rcrh6 Total loading time: 0 Render date: 2024-11-26T00:26:51.043Z Has data issue: false hasContentIssue false
  • English
  • Français

Quantum Monte Carlo Simulation for Atomic Resolution SEM/STEM Image

Published online by Cambridge University Press:  27 August 2014

Z. Ruan ,
M. Zhang ,
R.G. Zeng ,
B. Da ,
Y. Ming ,
S.F. Mao  and
Z.J. Ding
Z. Ruan
Affiliation:
Hefei National Laboratory for Physical Sciences at Microscale and Department of Physics, University of Science and Technology of China, 96 Jinzhai Road, Hefei, Anhui 230026, P.R. China
M. Zhang
Affiliation:
Hefei National Laboratory for Physical Sciences at Microscale and Department of Physics, University of Science and Technology of China, 96 Jinzhai Road, Hefei, Anhui 230026, P.R. China
R.G. Zeng
Affiliation:
Hefei National Laboratory for Physical Sciences at Microscale and Department of Physics, University of Science and Technology of China, 96 Jinzhai Road, Hefei, Anhui 230026, P.R. China
B. Da
Affiliation:
Hefei National Laboratory for Physical Sciences at Microscale and Department of Physics, University of Science and Technology of China, 96 Jinzhai Road, Hefei, Anhui 230026, P.R. China
Y. Ming
Affiliation:
School of Physics and Material Science, Anhui University, Hefei, Anhui 230601, P.R. China
S.F. Mao
Affiliation:
School of Nuclear Science and Technology, University of Science and Technology of China, 96 Jinzhai Road, Hefei, Anhui 230026, P.R. China
Z.J. Ding
Affiliation:
Hefei National Laboratory for Physical Sciences at Microscale and Department of Physics, University of Science and Technology of China, 96 Jinzhai Road, Hefei, Anhui 230026, P.R. China

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 30 - 31
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Zhu, Y. et al, Nat. Mater. 8 (2009), p. 808.Google Scholar
[2] Zeng, R. G. and Ding, Z.J., J. Surf. Anal. 17 (2011), p. 198.Google Scholar
[3] Ding, Z. J. and Shiimzu, R., Scanning 18 (1996), p. 92.Google Scholar
[4] Egerton, R. F., in “Electron Energy-Loss Spectroscopy in the Electron Microscope”, (Springer US, New York) p. 184.Google Scholar
[5] The authors acknowledge funding from the National Natural Science Foundation of China (Nos. 11274288 and 11204289), the National Basic Research Program of China (Nos. 2011CB932801 and 2012CB933702), Ministry of Education of China (No. 20123402110034) and “111” project (No. B07033), and Chinese Academy of Sciences (No. XXH12503-02-02-07.Google Scholar