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Quantitative STEM HAADF Analysis of Dilute Bi Containing GaAs

Published online by Cambridge University Press:  09 October 2013

N. Knaub
Affiliation:
A. Beyer
Affiliation:
P. Ludewig
Affiliation:
W. Stolz
Affiliation:
K. Volz
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2013