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Quantitative Interpretation and Information Limits in Annular Dark-Field STEM Images
Published online by Cambridge University Press: 02 July 2020
Extract
In making quantitative measurements using electron micrographs we must regard the electron microscope as being an information channel. The information about the object is both in some way transformed by the image forming process, and information is lost through the existence of a spatial resolution limit and the addition of noise. To make quantitative measurements, we need to take account of all these effects.
Great progress has been made in making quantitative measurements from high-resolution transmission electron microscope (HRTEM) images (for example see Ref. [1]). However, the simulation of HRTEM images requires a full dynamical electron scattering calculation in addition to computing the effects of the objective lens aberrations. Although such calculations can provide excellent agreement with experimental data, the calculation times involved restrict the number of trial structure models that can be used, with the danger that such trial and error methods might miss the true object solution.
- Type
- The Theory and Practice of Scanning Transmission Electron Microscopy
- Information
- Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 104 - 105
- Copyright
- Copyright © Microscopy Society of America