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Quantitative EDX and EELS Elemental Mapping at Atomic Resolution

Published online by Cambridge University Press:  27 August 2014

G. Kothleitner ,
M. J. Neish ,
N. R. Lugg ,
S. D. Findlay ,
W. Grogger ,
F. Hofer  and
L. J. Allen
G. Kothleitner
Affiliation:
Institute f. Electron Microscopy (FELMI), Graz University of Technology and Centre f. Electron Microscopy (ZFE), Graz, Steyrergasse 17, 8010 Graz, Austria
M. J. Neish
Affiliation:
School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia
N. R. Lugg
Affiliation:
School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia Institute of Engineering Innovation, The University of Tokyo, Tokyo 113-8656, Japan
S. D. Findlay
Affiliation:
School of Physics, Monash University, Clayton, Victoria 3800, Australia
W. Grogger
Affiliation:
Institute f. Electron Microscopy (FELMI), Graz University of Technology and Centre f. Electron Microscopy (ZFE), Graz, Steyrergasse 17, 8010 Graz, Austria
F. Hofer
Affiliation:
Institute f. Electron Microscopy (FELMI), Graz University of Technology and Centre f. Electron Microscopy (ZFE), Graz, Steyrergasse 17, 8010 Graz, Austria
L. J. Allen
Affiliation:
School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 570 - 571
Copyright
Copyright © Microscopy Society of America 2014 

References

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[11] The substantial help of Bernd Kraus, Paul Thomas, and Ray Twesten from Gatan, as well as Meiken Falke and Ralf Terborg from Bruker and Dimitri Klenov from FEI, in setting up this particular analytical hardware configuration is acknowledged.Google Scholar