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Quantitative characterization of nanometer-scale electric fields via momentum-resolved STEM

Published online by Cambridge University Press:  30 July 2021

Andreas Beyer ,
Saleh Firoozabadi ,
Damien Heimes ,
Tim Grieb ,
Andreas Rosenauer ,
Knut Müller-Caspary  and
Kerstin Volz
Andreas Beyer
Affiliation:
Materials Science Centre and Department of Physics, Philipps University Marburg, Hans-Meerwein-Straße 6, Marburg, 35032, Germany, Germany
Saleh Firoozabadi
Affiliation:
Materials Science Centre and Department of Physics, Philipps University Marburg, Hans-Meerwein-Straße 6, Marburg, 35032, Germany, Marburg, Hessen, Germany
Damien Heimes
Affiliation:
Materials Science Centre and Department of Physics, Philipps University Marburg, Hans-Meerwein-Straße 6, Marburg, 35032, Germany, Germany
Tim Grieb
Affiliation:
2Institut für Festkörperphysik, Universität Bremen, Otto-Hahn-Allee 1, Bremen, 28359, Germany, United States
Andreas Rosenauer
Affiliation:
Institut für Festkörperphysik, Universität Bremen, Otto-Hahn-Allee 1, Bremen, 28359, Germany, United States
Knut Müller-Caspary
Affiliation:
Ernst Ruska Centre for Microscopy and Spectroscopy with Electrons and the Peter Grünberg Institute Forschungszentrum Jülich, 52425Jülich, Germany, United States
Kerstin Volz
Affiliation:
Materials Science Centre and Department of Physics, Philipps University Marburg, Hans-Meerwein-Straße 6, Marburg, 35032, Germany, Germany

Abstract

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Type
Diffraction Imaging Across Disciplines
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2206 - 2207
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Beyer, A., Munde, M. S., Firoozabadi, S., Heimes, D., Grieb, T., Rosenauer, A., Müller-Caspary, K. & Volz, K. (2021). Quantitative Characterization of Nanometer-Scale Electric Fields via Momentum-Resolved STEM. Nano Letters accepted, acs.nanolett.0c04544. https://pubs.acs.org/doi/10.1021/acs.nanolett.0c04544.Google Scholar
Müller-Caspary, K., Krause, F. F., Grieb, T., Löffler, S., Schowalter, M., Béché, A., Galioit, V., Marquardt, D., Zweck, J., Schattschneider, P., Verbeeck, J. & Rosenauer, A. (2017). Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy. Ultramicroscopy 178, 62–80. http://linkinghub.elsevier.com/retrieve/pii/S0304399116300596.CrossRefGoogle ScholarPubMed
Oelerich, J. O., Duschek, L., Belz, J., Beyer, A., Baranovskii, S. D. & Volz, K. (2017). STEMsalabim: A high-performance computing cluster friendly code for scanning transmission electron microscopy image simulations of thin specimens. Ultramicroscopy 177.CrossRefGoogle ScholarPubMed
Ophus, C. (2019). Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond. Microscopy and Microanalysis 1–20. https://www.cambridge.org/core/product/identifier/S1431927619000497/type/journal_article.Google Scholar