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Quantitative Atomic-resolution Imaging and Spectroscopy of a 2D Silica Glass

Published online by Cambridge University Press:  23 November 2012

P.Y. Huang ,
R. Hovden ,
Q. Mao ,
D.A. Muller ,
S. Kurasch ,
U. Kaiser ,
J. Kotakoski ,
A. Krasheninnikov ,
A. Srivastava  and
V. Skakalova
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P.Y. Huang
Affiliation:
Applied Physics, Cornell University, Ithaca, NY
R. Hovden
Affiliation:
Applied Physics, Cornell University, Ithaca, NY
Q. Mao
Affiliation:
Applied Physics, Cornell University, Ithaca, NY
D.A. Muller
Affiliation:
Applied Physics, Cornell University, Ithaca, NY
S. Kurasch
Affiliation:
University of Ulm, Ulm, Germany
U. Kaiser
Affiliation:
University of Ulm, Ulm, Germany
J. Kotakoski
Affiliation:
University of Helsinki, Helsinki, Finland
A. Krasheninnikov
Affiliation:
University of Helsinki, Helsinki, Finland
A. Srivastava
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany
V. Skakalova
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany
J. Smet
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany
J. Meyer
Affiliation:
University of Vienna, Vienna, Austria
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 340 - 341
Copyright
Copyright © Microscopy Society of America 2012

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