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Quantitative Atomic Resolution Differential Phase Contrast Imaging Using a Segmented Area All Field Detector

Published online by Cambridge University Press:  25 July 2016

Gabriel Sanchez-Santolino ,
Takehito Seki ,
Nathan Lugg ,
Ryo Ishikawa ,
Daniel J. Taplin ,
Scott D. Findlay ,
Yuichi Ikuhara  and
Naoya Shibata
Gabriel Sanchez-Santolino
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, Japan
Takehito Seki
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, Japan
Nathan Lugg
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, Japan
Ryo Ishikawa
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, Japan
Daniel J. Taplin
Affiliation:
School of Physics and Astronomy, Monash University, Victoria, Australia
Scott D. Findlay
Affiliation:
School of Physics and Astronomy, Monash University, Victoria, Australia
Yuichi Ikuhara
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, Japan
Naoya Shibata
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, Japan

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 504 - 505
Copyright
© Microscopy Society of America 2016 

References

[1] Chapman, J. N., et al, Ultramicroscopy 3 (1978). pp. 203–214.Google Scholar
[2] Shibata, N., et al, Scientific Reports 5 (2015) 10040.Google Scholar
[3] Shibata, N., et al, Nature Physics 8 (2012). pp. 611–615.CrossRefGoogle Scholar
[4] Lubk, A. & Zweck, J. Phys. Rev. A 91 (2015) 023805.Google Scholar
[5] Close, R., et al, Ultramicroscopy 159 (2015). pp. 124–137.Google Scholar
[6] This work was supported by PRESTO and SENTAN, JST, and the JSPS KAKENHI Grant number 26289234. A part of this work was supported by Grant-in-Aid for Scientific Research on Innovative Areas (25106003). A part of this work was conducted in the Research Hub for Advanced Nano Characterization, The University of Tokyo, under the support of "Nanotechnology Platform" (Project No.12024046) by MEXT, Japan. This research was supported under the Discovery Projects funding scheme of the Australian Research Council (Project Nos. DP110101570 and DP160102338).Google Scholar