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Quantitative Analysis of Atomic-Resolution X-ray Maps in an Aberration- Corrected Scanning Transmission Electron Microscope with a Large Solid- Angle Detector

Published online by Cambridge University Press:  23 November 2012

M. Watanabe ,
A. Yasuhara  and
E. Okunishi
M. Watanabe
Affiliation:
Dept. of Mater. Sci. & Eng., Lehigh University, Bethlehem, PA
A. Yasuhara
Affiliation:
JEOL, Akishima, Tokyo, Japan
E. Okunishi
Affiliation:
JEOL, Akishima, Tokyo, Japan
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 974 - 975
Copyright
Copyright © Microscopy Society of America 2012

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