Hostname: page-component-78c5997874-xbtfd Total loading time: 0 Render date: 2024-11-20T03:28:02.880Z Has data issue: false hasContentIssue false
  • English
  • Français

Quantitative Analysis of Atomic Resolution HAADF-STEM (Z-contrast) Imaging for PbTiO3 / SrTiO3 Substrate Dielectric Thin Films

Published online by Cambridge University Press:  31 July 2006

Y Kotaka ,
K Honda ,
T Yamazaki ,
K Watanabe ,
H Fujisawa  and
M Shimizu
Y Kotaka
Affiliation:
Fujitusu Laboratories
K Honda
Affiliation:
Fujitusu Laboratories
T Yamazaki
Affiliation:
Tokyo University of Science,Japan
K Watanabe
Affiliation:
Tokyo Metropolitan College of Technology,Japan
H Fujisawa
Affiliation:
University of Hyogo,Japan
M Shimizu
Affiliation:
University of Hyogo,Japan

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1352 - 1353
Copyright
© 2006 Microscopy Society of America