Quantitation Procedures for Electron Probe Microanalysis of Polished Materials, Thin Films and Particles: The Past and Next Thirty Five Years

J T Armstrong

doi:10.1017/S1431927605508286

Quantitation Procedures for Electron Probe Microanalysis of Polished Materials, Thin Films and Particles: The Past and Next Thirty Five Years

Published online by Cambridge University Press: 01 August 2005

J T Armstrong

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J T Armstrong: Affiliation:
American University, Washington, DC

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type: Research Article
Information: Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 1354 - 1355

DOI: https://doi.org/10.1017/S1431927605508286 [Opens in a new window]

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Quantitation Procedures for Electron Probe Microanalysis of Polished Materials, Thin Films and Particles: The Past and Next Thirty Five Years

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