Hostname: page-component-78c5997874-s2hrs Total loading time: 0 Render date: 2024-11-16T16:59:43.512Z Has data issue: false hasContentIssue false
  • English
  • Français

Quantification of STEM-EDS With Ion Implantation

Published online by Cambridge University Press:  25 July 2016

R. Garcia ,
Y. Liu  and
F. A. Stevie
R. Garcia
Affiliation:
Analytical Instrumentation Facility, North Carolina State University, Raleigh, NC 27695, USA
Y. Liu
Affiliation:
Analytical Instrumentation Facility, North Carolina State University, Raleigh, NC 27695, USA
F. A. Stevie
Affiliation:
Analytical Instrumentation Facility, North Carolina State University, Raleigh, NC 27695, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 138 - 139
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Vartuli, C. B., et al, Microscopy and Microanalysis Proceedings Vol. 6(Suppl. 2 (2000). p. 536.CrossRefGoogle Scholar
[2] Vartuli, C. B., et al, Microscopy and Microanalysis Proceedings (2001). p. 200.CrossRefGoogle Scholar
[3] Vartuli, C. B., et al, Microscopy and Microanalysis Proceedings (2002) 8(Suppl. 2) p. 1192CD.CrossRefGoogle Scholar
[4] Giannuzzi, L. A., et al, in Introduction to Focused Ion Beams (eds. L. A. Giannuzzi & F. A. Stevie, (Springer, New York) (2005). p. 201.CrossRefGoogle Scholar
[5] Wilson, R. G., Stevie, F. A. & Magee, C. W. Secondary Ion Mass Spectrometry. Wiley, New York (1989). Section 3.1.Google Scholar
[6] Stevie, F. A. Secondary Ion Mass Spectrometry. Momentum Press, New York (2016). Chapter 6.Google Scholar