Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-27T09:42:17.395Z Has data issue: false hasContentIssue false
  • English
  • Français

Quantification of Epitaxial Strain and Crystal Structure in Nanoscale Oxide Films Using Position Averaged Convergent Beam Electron Diffraction

Published online by Cambridge University Press:  09 October 2013

J. Hwang ,
J.Y. Zhang ,
J. Son ,
E. Mikheev ,
A.J. Hauser  and
S. Stemmer
J. Hwang
Affiliation:
J.Y. Zhang
Affiliation:
J. Son
Affiliation:
E. Mikheev
Affiliation:
A.J. Hauser
Affiliation:
S. Stemmer
Affiliation:

Abstract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 686 - 687
Copyright
Copyright © Microscopy Society of America 2013