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Quantification of CeO2 Reduction By In Situ Electron Energy-Loss Spectroscopy

Published online by Cambridge University Press:  02 July 2020

Renu Sharma  and
Peter Crozier
Renu Sharma
Affiliation:
Center for Solid State Science, Arizona State University, Tempe, AZ85287
Peter Crozier
Affiliation:
Center for Solid State Science, Arizona State University, Tempe, AZ85287
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Extract

CeO2 is an important material in many catalyst applications. CeO2, PrO2 and TbO2 are the only lanthanides known to exist as oxides in both 3+ and 4+ oxidation states. The high oxygen mobility at low temperature (≈300°C) results in easy oxidation-reduction cycles; a property utilized in the catalyst industry, especially for CeO2. Studying the oxidation-reduction behavior is thus very important to understanding the reactivity of CeO2 as a catalyst. We have studied CeO2 by in situ electron diffraction, high resolution electron microscopy (HREM) and electron energy-loss spectroscopy (EELS), not only to understand the reduction behavior but also to develop a method to quantify the reducibility of CeO2 or mixed oxides containing CeO2 by EELS. We have applied this method to study the behavior of ZrO2-CeO2 catalyst during reduction.

Experiments were performed on a PHILIPS-430 electron microscope operated at 300KV, fitted with a differentially pumped environmental cell and a Gatan Imaging Filter (GIF).

Type
Sir John Meurig Thomas Symposium: Microscopy and Microanalysis in the Chemical Sciences
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 12 - 13
Copyright
Copyright © Microscopy Society of America

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References

References:

1.Cuif, J.P et al, SAE Paper 961906 (1996).Google Scholar
2.Kang, Z.C et al, Z. anorg. allg. Chem. 622(1996)465.CrossRefGoogle Scholar
3.Sharma, Renu and, Weiss, Karl, Microscopy Research and Technique 42(1998)270.3.0.CO;2-U>CrossRefGoogle Scholar
4. Stimulating discussions with Dr. Z.C. Kang and Prof. L. Eyring, a DOE instrumentation grant (#DEFG0395TE00068) and Center for High Resolution Electron Microscopy are gratefully acknowledged.Google Scholar