Hostname: page-component-78c5997874-94fs2 Total loading time: 0 Render date: 2024-11-04T21:14:58.384Z Has data issue: false hasContentIssue false
  • English
  • Français

Pushing the Limits of Fast Acquisition in TEM Tomography and 4D-STEM

Published online by Cambridge University Press:  25 July 2016

M. Simson ,
R.E. Dunin-Borkowski ,
R. Hartmann ,
M. Huth ,
S. Ihle ,
L. Jones ,
Y. Kondo ,
V. Migunov ,
P.D. Nellist  and
R. Ritz
...Show all authors
M. Simson
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
R.E. Dunin-Borkowski
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, FZJ, 52425 Jülich, Germany
R. Hartmann
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 München, Germany
M. Huth
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
S. Ihle
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
L. Jones
Affiliation:
Department of Materials, University of Oxford, 13 Parks Road, Oxford OX13PH, UK
Y. Kondo
Affiliation:
JEOL Ltd., 3-1-2 Musashino Akishima Tokyo 196-8558, Japan
V. Migunov
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
P.D. Nellist
Affiliation:
Department of Materials, University of Oxford, 13 Parks Road, Oxford OX13PH, UK
R. Ritz
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
H. Ryll
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 München, Germany
R. Sagawa
Affiliation:
JEOL Ltd., 3-1-2 Musashino Akishima Tokyo 196-8558, Japan
J. Schmidt
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
H. Soltau
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
L. Strüder
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 München, Germany
H. Yang
Affiliation:
Department of Materials, University of Oxford, 13 Parks Road, Oxford OX13PH, UK

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 512 - 513
Copyright
© Microscopy Society of America 2016 

References

[1] Ryll, H, et al, Microscopy and Microanalysis 19 (2013). p. 1160–1161.CrossRefGoogle Scholar
[2] Migunov, V, et al, Scientific Reports 5 (2015) 14516.CrossRefGoogle Scholar
[3] Rodenburg, JM, McCallum, BC & Nellist, PD Ultramicroscopy 48 (1993). p. 304–314.CrossRefGoogle Scholar
[4] Batenburg, KJ & Sijbers, J IEEE Trans. Image Process 20 (2011). p. 2542–2553.CrossRefGoogle Scholar
[5] The authors acknowledge Xiaodong Zhuge, K. Joost Batenburg and Lothar Houben for their contributions to the tomography measurement.Google Scholar