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Pushing back the frontiers of CRYO in 120 kV TEMs

Published online by Cambridge University Press:  03 August 2008

SA Hiller ,
C Dietl ,
V Seybold ,
M Thaler  and
G Benner
SA Hiller
Affiliation:
Carl Zeiss SMT, Germany
C Dietl
Affiliation:
Carl Zeiss SMT, Germany
V Seybold
Affiliation:
Carl Zeiss SMT, Germany
M Thaler
Affiliation:
Carl Zeiss SMT, Germany
G Benner
Affiliation:
Carl Zeiss SMT, Germany
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1326 - 1327
Copyright
© 2008 Microscopy Society of America

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