Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-29T13:19:23.279Z Has data issue: false hasContentIssue false
  • English
  • Français

Public-opened Internet Electron Microscopy 2005 in Japan ---- Remote-control SEM and TEM for High-school Users ----

Published online by Cambridge University Press:  01 August 2005

K Furuya ,
M Tanaka ,
K Mitsuishi ,
N Ishikawa ,
A Tameike ,
M Date ,
A Yamada  and
Y Okura
K Furuya
Affiliation:
National Institute for Materials Science,Japan
M Tanaka
Affiliation:
National Institute for Materials Science,Japan
K Mitsuishi
Affiliation:
National Institute for Materials Science,Japan
N Ishikawa
Affiliation:
National Institute for Materials Science,Japan
A Tameike
Affiliation:
National Institute for Materials Science,Japan
M Date
Affiliation:
JEOL,Japan
A Yamada
Affiliation:
JEOL,Japan
Y Okura
Affiliation:
JEOL,Japan

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 68 - 69
Copyright
© 2005 Microscopy Society of America