Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-26T10:35:26.361Z Has data issue: false hasContentIssue false
  • English
  • Français

Prospects for Detecting Single Vacancies by Quantitative Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  23 September 2015

Jie Feng ,
Alexander V. Kvit ,
Andrew B. Yankovich ,
Chenyu Zhang ,
Dane Morgan  and
Paul M. Voyles
Jie Feng
Affiliation:
Materials Science Program, University of Wisconsin-Madison, Madison, WI, 53706, USA
Alexander V. Kvit
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, 53706, USA
Andrew B. Yankovich
Affiliation:
Materials Science Program, University of Wisconsin-Madison, Madison, WI, 53706, USA Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, 53706, USA
Chenyu Zhang
Affiliation:
Materials Science Program, University of Wisconsin-Madison, Madison, WI, 53706, USA Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, 53706, USA
Dane Morgan
Affiliation:
Materials Science Program, University of Wisconsin-Madison, Madison, WI, 53706, USA Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, 53706, USA
Paul M. Voyles
Affiliation:
Materials Science Program, University of Wisconsin-Madison, Madison, WI, 53706, USA Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, 53706, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1887 - 1888
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Yankovich, A. B., et al., Nat. Commun. 5 (2014). p 4155.CrossRefGoogle Scholar
[2] Kirkland, E.J. in Advanced Computing in Electron Microscopy, 1st Edition, Springer, 1998.CrossRefGoogle Scholar
[3] Voyles, P. M., et al., Ultramicroscopy. 96 (2003). p 251.Google Scholar
[4] This work was supported by the US Department of Energy, Basic Energy Sciences, Grant DE-FG02-08ER46547..Google Scholar