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Probing Thermal-induced Phonon Energy Shift of SiC in Nanoscale by in situ Vibrational Spectroscopy

Published online by Cambridge University Press:  05 August 2019

Xingxu Yan ,
Chengyan Liu ,
Chaitanya A. Gadre ,
Ruqian Wu  and
Xiaoqing Pan
Xingxu Yan
Affiliation:
Department of Materials Science and Engineering, University of California - Irvine, Irvine, CA, USA.
Chengyan Liu
Affiliation:
Department of Materials Science and Engineering, University of California - Irvine, Irvine, CA, USA.
Chaitanya A. Gadre
Affiliation:
Department of Physics and Astronomy, University of California - Irvine, Irvine, CA, USA.
Ruqian Wu
Affiliation:
Department of Physics and Astronomy, University of California - Irvine, Irvine, CA, USA.
Xiaoqing Pan
Affiliation:
Department of Materials Science and Engineering, University of California - Irvine, Irvine, CA, USA. Department of Physics and Astronomy, University of California - Irvine, Irvine, CA, USA. Irvine Materials Research Institute (IMRI), University of California - Irvine, Irvine, CA, USA.

Abstract

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Type
Current Trends and Challenges in Electron Energy-Loss Spectroscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 622 - 623
Copyright
Copyright © Microscopy Society of America 2019 

References

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[8]This work was supported by the Department of Energy (DOE) under Grant DE-SC0014430. TEM experiments was conducted using the facilities in the Irvine Materials Research Institute (IMRI) at the University of California-Irvine.Google Scholar