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Probing the Strain Fields of Single-Atom Defects in 2D materials with Sub-Picometer Precision

Published online by Cambridge University Press:  30 July 2021

Chia-Hao Lee ,
Abid Khan ,
Di Luo ,
Tatiane Santos ,
Chuqiao Shi ,
Blanka Janicek ,
Sangmin Kang ,
Nahil Sobh ,
Wenjuan Zhu  and
André Schleife
...Show all authors
Chia-Hao Lee
Affiliation:
University of Illinois at Urbana-Champaign, United States
Abid Khan
Affiliation:
University of Illinois at Urbana-Champaign, United States
Di Luo
Affiliation:
University of Illinois at Urbana-Champaign, United States
Tatiane Santos
Affiliation:
UIUC, United States
Chuqiao Shi
Affiliation:
UIUC, United States
Blanka Janicek
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States
Sangmin Kang
Affiliation:
UIUC, United States
Nahil Sobh
Affiliation:
UIUC, United States
Wenjuan Zhu
Affiliation:
UIUC, United States
André Schleife
Affiliation:
University of Illinois at Urbana-Champaign, United States
Bryan Clark
Affiliation:
University of Illinois at Urbana-Champaign, United States
Pinshane Huang
Affiliation:
University of Illinois at Urbana-Champaign, United States

Abstract

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Type
Defects in Materials: How We See and Understand Them
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1944
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Lee, C. H. et al. , Nano Letters 20 (2020), p. 3369-3377Google Scholar
Code available at: https://github.com/ClarkResearchGroup/stem-learningGoogle Scholar
This work is supported primarily through DOE BES under DE-SC0020190. Additional support from AFOSR FA9550-7-1-0213, ONR grant numbers N00014-17-1-2973 and N00014-18-1-2605, NSF OCI-0725070 and ACI-1238993, and the state of Illinois. This work was carried out in part in the Materials Research Laboratory at UIUC.Google Scholar