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Probing the Crystallography of Ordered Phases by coupling Orientation Microscopy and Atom Probe Tomography

Published online by Cambridge University Press:  27 August 2014

S. Meher ,
P. Nandwana ,
T. Rojhirunsakool ,
J. Tiley  and
R. Banerjee
S. Meher
Affiliation:
Center for Advanced Research and Technology and Department of Materials Science and Engineering, University of North Texas, Denton, TX, U.S.A.
P. Nandwana
Affiliation:
Center for Advanced Research and Technology and Department of Materials Science and Engineering, University of North Texas, Denton, TX, U.S.A.
T. Rojhirunsakool
Affiliation:
Center for Advanced Research and Technology and Department of Materials Science and Engineering, University of North Texas, Denton, TX, U.S.A.
J. Tiley
Affiliation:
Materials and Manufacturing Directorate, Air Force Research Laboratory, Dayton, OH, USA
R. Banerjee
Affiliation:
Center for Advanced Research and Technology and Department of Materials Science and Engineering, University of North Texas, Denton, TX, U.S.A.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 958 - 959
Copyright
Copyright © Microscopy Society of America 2014 

References

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