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Probing point and planar defects in multiferroic YFeO3 thin films

Published online by Cambridge University Press:  30 July 2021

Abinash Kumar ,
Shuai Ning ,
Konstantin Klyukin ,
Bilge Yildiz ,
Caroline Ross  and
James LeBeau
Abinash Kumar
Affiliation:
Massachusetts Institute of Technology, Cambridge, Massachusetts, United States
Shuai Ning
Affiliation:
Massachusetts Institute of Technology, Cambridge, Massachusetts, United States
Konstantin Klyukin
Affiliation:
Massachusetts Institute of Technology, Cambridge, Massachusetts, United States
Bilge Yildiz
Affiliation:
Massachusetts Institute of Technology, Cambridge, Massachusetts, United States
Caroline Ross
Affiliation:
Massachusetts Institute of Technology, Cambridge, Massachusetts, United States
James LeBeau
Affiliation:
Massachusetts Institute of Technology, Cambridge, Massachusetts, United States

Abstract

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Type
Defects in Materials: How We See and Understand Them
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2144 - 2145
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Klyukin, K. and Alexandrov, V., Physical Review B 95 (2017) p. 035301CrossRefGoogle Scholar
McKenna, K. P. et al. , Nature Communications 5 (2014), p. 5740.CrossRefGoogle Scholar
Shang, M. et al. , Materials Letters 175 (2016), p. 23Google Scholar
Salmon, J. et al. , Journal of Mathematical Imaging and Vision 48 (2014) p. 279CrossRefGoogle Scholar
This material is based upon work supported by the National Science Foundation under MRSEC program, DMR 1419807.Google Scholar