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Probing Phonon and Infrared-Plasmons in Nanoscale Interfaces

Published online by Cambridge University Press:  05 August 2019

MJ Lagos*
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, Ontario, Canada. Canadian Centre for Electron Microscopy, McMaster University, Hamilton, Ontario, Canada.
U Hohenester
Affiliation:
Department of Physics, University of Graz, Graz, Austria.
A Trugler
Affiliation:
Department of Physics, University of Graz, Graz, Austria.
V Amarasinghe
Affiliation:
Department of Physics and Astronomy, Rutgers University, Piscataway, New Jersey, USA.
LC Feldman
Affiliation:
Department of Physics and Astronomy, Rutgers University, Piscataway, New Jersey, USA.
PE Batson
Affiliation:
Department of Physics and Astronomy, Rutgers University, Piscataway, New Jersey, USA.
GA Botton
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, Ontario, Canada. Canadian Centre for Electron Microscopy, McMaster University, Hamilton, Ontario, Canada.
*
*Corresponding author: [email protected]

Abstract

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Type
Current Trends and Challenges in Electron Energy-Loss Spectroscopy
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Lagos, MJ et al. , Nature 543 (2017), p. 529.Google Scholar
[2]Lagos, MJ and Batson, PE, NanoLetters 18 (2018), p. 4556.Google Scholar
[3]Lagos, MJ and Batson, PE, Microscopy and MicroAnalysis 2017 Conference abstract PDP44 (2017). https://www.microscopy.org/MandM/2017/program/abstracts/PDP-44_Lagos.pdf.Google Scholar
[4]Lagos, MJ et al. , Microscopy 67 (2018), p. i3.Google Scholar
[5]Rossouw, D and Botton, GA, Physical Review Letters 110 (2013), p. 066801.Google Scholar
[6]For financial support, M.J.L. and G.A.B. acknowledge the Natural Sciences and Engineering Research Council (NSERC) under a discovery grant; P.E.B. acknowledges support of U.S. Department of Energy, Office of Science, Basic Energy Sciences, under award no. DE-SC0005132Google Scholar