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Probing Intertwined Interactions in Strongly Correlated Material Systems Using Transmission Electron Microscopy

Published online by Cambridge University Press:  22 July 2022

Jing Tao*
Affiliation:
Department of Physics, University of Science and Technology of China, Hefei, Anhui, China

Abstract

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Type
On Demand - Memorial Symposium: John C.H. Spence
Copyright
Copyright © Microscopy Society of America 2022

References

Zuo, J. and Tao, J., Phys. Rev. B 63, 050407(R) (2001)Google Scholar
Tao, J., et al. , Phys. Rev. Lett. 103, 097202 (2009)10.1103/PhysRevLett.103.097202CrossRefGoogle Scholar
Tao, J., et al. , Proc. Natl. Acad. Sci., 108, 20941 (2011)10.1073/pnas.1107762108CrossRefGoogle Scholar
Li, J., et al. , Phys. Rev. B 101, 100304 (R) (2020).10.1103/PhysRevB.101.100304CrossRefGoogle Scholar