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Probing Graphene Defect Kinetics at Millisecond Time Resolution Using Direct Detection and Machine Learning

Published online by Cambridge University Press:  22 July 2022

Chen Huang
Affiliation:
Rosalind Franklin Institute, Didcot, OX11 0FA, UK Department of Materials, University of Oxford, Oxford, OX1 3PH, UK
Christopher Allen
Affiliation:
Department of Materials, University of Oxford, Oxford, OX1 3PH, UK Electron Physical Science Imaging Centre, Diamond Light Source, Didcot, OX11 0DE, UK
Stephen Skowron
Affiliation:
School of Chemistry, University of Nottingham, Nottingham, NG7 2RD, UK
Ivan Lobato
Affiliation:
Electron Microscopy for Materials Research (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium
Takeo Sasaki
Affiliation:
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo, 196-8558, Japan
Sandra Van Aert
Affiliation:
Electron Microscopy for Materials Research (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium
Elena Besley
Affiliation:
School of Chemistry, University of Nottingham, Nottingham, NG7 2RD, UK
Angus Kirkland
Affiliation:
Rosalind Franklin Institute, Didcot, OX11 0FA, UK Department of Materials, University of Oxford, Oxford, OX1 3PH, UK Electron Physical Science Imaging Centre, Diamond Light Source, Didcot, OX11 0DE, UK

Abstract

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Type
Imaging Chemical Reactions using High Speed Electron Microscopy (EM)
Copyright
Copyright © Microscopy Society of America 2022

References

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