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Probing defects and impurity-induced electronic structure changes in single and double-layer hexagonal boron nitride sheets with STEM-EELS

Published online by Cambridge University Press:  23 November 2012

Q. Ramasse ,
N. Alem ,
A. Zettl ,
O. Yazyev ,
C. Pan ,
R. Nair ,
R. Jalil ,
R. Zan ,
U. Bangert  and
K.S. Novoselov
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Q. Ramasse
Affiliation:
SuperSTEM Laboratory, Daresbury, United Kingdom
N. Alem
Affiliation:
University of California Berkeley, Berkeley, United Kingdom
A. Zettl
Affiliation:
University of California Berkeley, Berkeley, United Kingdom
O. Yazyev
Affiliation:
Ecole Polytechnique Federale de Lausanne, Lausanne, Switzerland
C. Pan
Affiliation:
University of Manchester, Manchester, United Kingdom
R. Nair
Affiliation:
University of Manchester, Manchester, United Kingdom
R. Jalil
Affiliation:
University of Manchester, Manchester, United Kingdom
R. Zan
Affiliation:
University of Manchester, Manchester, United Kingdom
U. Bangert
Affiliation:
University of Manchester, Manchester, United Kingdom
K.S. Novoselov
Affiliation:
University of Manchester, Manchester, United Kingdom
C. Seabourne
Affiliation:
University of Leeds, Leeds, United Kingdom
A.J. Scott
Affiliation:
University of Leeds, Leeds, United Kingdom
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1526 - 1527
Copyright
Copyright © Microscopy Society of America 2012

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