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Probing Crystalline Defects Using an EBSD-Based Virtual Dark-Field Method

Published online by Cambridge University Press:  05 August 2019

Shiteng Zhao ,
Ruopeng Zhang ,
Thomas Pekin  and
Andrew M. Minor
Shiteng Zhao
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA. Department of Materials Science & Engineering, University of California, Berkeley, CA, USA.
Ruopeng Zhang
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA. Department of Materials Science & Engineering, University of California, Berkeley, CA, USA.
Thomas Pekin
Affiliation:
Department of Physics, Humboldt-Universität zu Berlin, Berlin, Germany.
Andrew M. Minor*
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA. Department of Materials Science & Engineering, University of California, Berkeley, CA, USA.
*
*Corresponding author: Andrew Minor; [email protected]

Abstract

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Type
Electron Crystallography of Nano-structures in Nanotechnology, Materials and Bio-Sciences
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1992 - 1993
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Gammer, C et al. , Ultramicroscopy 155 (2015).Google Scholar
[2]Brodusch, N, Demers, H and Gauvin, R., Ultramicroscopy 148 (2015).Google Scholar
[3]Ozdol, VB et al. , Applied Physics Letters 106 (2015).Google Scholar