Hostname: page-component-78c5997874-xbtfd Total loading time: 0 Render date: 2024-11-20T03:27:37.219Z Has data issue: false hasContentIssue false
  • English
  • Français

Preparation of Site Specific Atom Probe Tips using Focused Ion Beam Technology

Published online by Cambridge University Press:  31 July 2006

D McGrouther ,
W McKenzie ,
D Saxey ,
JM Cairney ,
R Marceau ,
SP Ringer  and
PR Munroe
D McGrouther
Affiliation:
University of New South Wales
W McKenzie
Affiliation:
University of New South Wales
D Saxey
Affiliation:
University of Sydney
JM Cairney
Affiliation:
University of Sydney
R Marceau
Affiliation:
University of Sydney
SP Ringer
Affiliation:
University of Sydney
PR Munroe
Affiliation:
University of New South Wales

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1296 - 1297
Copyright
© 2006 Microscopy Society of America