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Precision Limits to STEM Imaging from Dynamical Scattering and Channeling of Sub-Angstrom Electron Probes

Published online by Cambridge University Press:  27 August 2014

Andrew B. Yankovich  and
Paul M. Voyles

Abstract

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Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 120 - 121
Copyright
Copyright © Microscopy Society of America 2014 

References

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[8] Acknowledgements: Work was funded by the Department of Energy, Basic Energy Sciences (DE-FG02-08ER46547).Google Scholar