Hostname: page-component-78c5997874-dh8gc Total loading time: 0 Render date: 2024-11-17T11:26:11.749Z Has data issue: false hasContentIssue false
  • English
  • Français

Practical Remote Electron Microscopy - A Vendor's Perspective

Published online by Cambridge University Press:  09 April 2017

T Isabell ,
N Erdman ,
V Robertson ,
I Ishikawa ,
K Somehara  and
T Nakamichi
T Isabell
Affiliation:
JEOL USA
N Erdman
Affiliation:
JEOL USA
V Robertson
Affiliation:
JEOL USA
I Ishikawa
Affiliation:
JEOL USA
K Somehara
Affiliation:
JEOL Ltd, Japan
T Nakamichi
Affiliation:
JEOL Ltd, Japan

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 868 - 869
Copyright
Copyright © Microscopy Society of America 2011