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Post-Specimen Cc Correction Enabled Scanning Confocal Electron Energy Loss Microscopy for High-Throughput 3-D Spectroscopic Imaging of Nanomaterials

Published online by Cambridge University Press:  09 October 2013

H.L. Xin ,
H. Zheng  and
P. Ercius
H.L. Xin
Affiliation:
H. Zheng
Affiliation:
P. Ercius
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 536 - 537
Copyright
Copyright © Microscopy Society of America 2013