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Position and Energy Resolving X-ray and Electron Detectors

Published online by Cambridge University Press:  05 August 2007

L Strüder ,
R Hartmann ,
P Holl ,
P Lechner ,
G Lutz ,
R Richter ,
H Soltau ,
J Treis ,
R Eckhardt  and
K Heinzinger
...Show all authors
L Strüder
Affiliation:
Max-Planck-Institut für extraterrestrische Physik
R Hartmann
Affiliation:
PNSensor GmbH
P Holl
Affiliation:
PNSensor GmbH
P Lechner
Affiliation:
PNSensor GmbH
G Lutz
Affiliation:
PNSensor GmbH
R Richter
Affiliation:
Max-Planck-Institut für Physik
H Soltau
Affiliation:
PNSensor GmbH
J Treis
Affiliation:
Max-Planck-Institut für extraterrestrische Physik
R Eckhardt
Affiliation:
PNSensor GmbH
K Heinzinger
Affiliation:
PNSensor GmbH
D Miessner
Affiliation:
Max-Planck-Institut für extraterrestrische Physik
G Schaller
Affiliation:
Max-Planck-Institut für extraterrestrische Physik
M Schnecke
Affiliation:
Max-Planck-Institut für Physik
F Schopper
Affiliation:
Max-Planck-Institut für extraterrestrische Physik,Germany
S Herrmann
Affiliation:
Max-Planck-Institut für extraterrestrische Physik,Germany
O Hälker
Affiliation:
Max-Planck-Institut für extraterrestrische Physik,Germany
S Wölfl
Affiliation:
Max-Planck-Institut für extraterrestrische Physik,Germany
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 1346 - 1347
Copyright
© 2007 Microscopy Society of America

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