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Polar Oxide Interface Characterization by Differential Phase Contrast STEM

Published online by Cambridge University Press:  27 August 2014

N. Shibata ,
S.D. Findlay  and
Y. Ikuhara
N. Shibata
Affiliation:
Institute of Engineering Innovation, The University of Tokyo, Tokyo 113-8656 Japan PRESTO, Japan Science and Technology Agency, Saitama 332-0012, Japan
S.D. Findlay
Affiliation:
School of Physics, Monash University, Victoria 3800, Australia
Y. Ikuhara
Affiliation:
Institute of Engineering Innovation, The University of Tokyo, Tokyo 113-8656 Japan Nanostructures Research Laboratory, Japan Fine Ceramic Center, Nagoya, 456-8587, Japan

Abstract

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Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1034 - 1035
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Findlay, S.D., et al., Appl. Phys. Lett. 95, 191913 (2009).Google Scholar
[2] Findlay, S. D., et al., Ultramicroscopy 110, 903 (2010).Google Scholar
[3] Shibata, N., et al., J. Electron Microscopy 59, 473 (2010).Google Scholar
[4] Shibata, N., et al., Nature Physics, 8, 611-615 (2012).Google Scholar
[5] Findlay, S.D., et al., Ultramicroscopy, 136, 31 (2014).Google Scholar
[6] Shibata, N., et al., submitted.Google Scholar
[7] We thank T. Matsumoto (U. Tokyo) for useful discussion and Y. Kohno, H. Sawada and Y. Kondo (JEOL Ltd.) for their collaboration in the detector development. This work was supported by the PRESTO, JST and the JSPS KAKENHI Grant number 23686093. A part of this work was conducted in Research Hub for Advanced Nano Characterization, The University of Tokyo, under the support of "Nanotechnology Platform" (project No.12024046) by MEXT, Japan. This research was supported under the Discovery Projects funding scheme of the Australian Research Council (Project No. DP110101570).Google Scholar