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P-N Junction Observation in a Single Transistor Device by In-situ TEM Electrical Measurement

Published online by Cambridge University Press:  03 August 2008

SY Park ,
D Cha ,
O Lourie  and
MJ Kim
SY Park
Affiliation:
University of Texas, Dallas
D Cha
Affiliation:
University of Texas, Dallas
O Lourie
Affiliation:
Nanofactory Instruments AB
MJ Kim
Affiliation:
University of Texas, Dallas
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 402 - 403
Copyright
© 2008 Microscopy Society of America

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