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Phase Detection Using Low-Loss EELS with Aberration Corrected STEM

Published online by Cambridge University Press:  08 April 2017

C Schamp ,
G Casillas  and
M Jose-Yacaman
C Schamp
Affiliation:
SVTC Technologies
G Casillas
Affiliation:
University of Texas, San Antonio
M Jose-Yacaman
Affiliation:
University of Texas, San Antonio

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 820 - 821
Copyright
Copyright © Microscopy Society of America 2011