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Phase Contrast Aberration Corrected Electron Microscope for Phase Plate Imaging

Published online by Cambridge University Press:  01 August 2010

E Majorovits ,
B Barton ,
G Benner ,
C Dietl ,
W Kühlbrandt ,
S Lengweiler ,
T Mandler ,
M Matijevic ,
H Niebel  and
R Schröder
E Majorovits
Affiliation:
Carl Zeiss NTS, Germany
B Barton
Affiliation:
Max-Planck-Institute for Biophysics, Germany
G Benner
Affiliation:
Carl Zeiss NTS, Germany
C Dietl
Affiliation:
Carl Zeiss NTS, Germany
W Kühlbrandt
Affiliation:
Max-Planck-Institute for Biophysics, Germany
S Lengweiler
Affiliation:
Carl Zeiss NTS, Germany
T Mandler
Affiliation:
Carl Zeiss NTS, Germany
M Matijevic
Affiliation:
Carl Zeiss NTS, Germany
H Niebel
Affiliation:
Carl Zeiss NTS, Germany
R Schröder
Affiliation:
University of Heidelberg, Germany

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 534 - 535
Copyright
Copyright © Microscopy Society of America 2010