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Performance of Dynamically Simulated Reference Patterns for Cross-Correlation Electron Backscatter Diffraction

Published online by Cambridge University Press:  10 August 2016

Brian E. Jackson ,
Jordan J. Christensen ,
Saransh Singh ,
Marc De Graef ,
David T. Fullwood ,
Eric R. Homer  and
Robert H. Wagoner
Brian E. Jackson
Affiliation:
Mechanical Engineering Department, Brigham Young University, Provo, UT 84602, USA
Jordan J. Christensen
Affiliation:
Mechanical Engineering Department, Brigham Young University, Provo, UT 84602, USA
Saransh Singh
Affiliation:
Department of Materials Science and Engineering, Carnegie Mellon University, 5000 Forbes Avenue, Pittsburgh, PA 15213, USA
Marc De Graef
Affiliation:
Department of Materials Science and Engineering, Carnegie Mellon University, 5000 Forbes Avenue, Pittsburgh, PA 15213, USA
David T. Fullwood*
Affiliation:
Mechanical Engineering Department, Brigham Young University, Provo, UT 84602, USA
Eric R. Homer
Affiliation:
Mechanical Engineering Department, Brigham Young University, Provo, UT 84602, USA
Robert H. Wagoner
Affiliation:
Department of Material Science and Engineering, Ohio State University, 2041 College Rd, Columbus, OH 43210, USA
*
*Corresponding author. [email protected]
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Abstract

High-resolution (or “cross-correlation”) electron backscatter diffraction analysis (HR-EBSD) utilizes cross-correlation techniques to determine relative orientation and distortion of an experimental electron backscatter diffraction pattern with respect to a reference pattern. The integrity of absolute strain and tetragonality measurements of a standard Si/SiGe material have previously been analyzed using reference patterns produced by kinematical simulation. Although the results were promising, the noise levels were significantly higher for kinematically produced patterns, compared with real patterns taken from the Si region of the sample. This paper applies HR-EBSD techniques to analyze lattice distortion in an Si/SiGe sample, using recently developed dynamically simulated patterns. The results are compared with those from experimental and kinematically simulated patterns. Dynamical patterns provide significantly more precision than kinematical patterns. Dynamical patterns also provide better estimates of tetragonality at low levels of distortion relative to the reference pattern; kinematical patterns can perform better at large values of relative tetragonality due to the ability to rapidly generate patterns relating to a distorted lattice. A library of dynamically generated patterns with different lattice parameters might be used to achieve a similar advantage. The convergence of the cross-correlation approach is also assessed for the different reference pattern types.

Keywords

cross-correlation EBSDsimulated electron backscatter diffractiondynamical electron scatteringkinematical EBSD simulationHR-EBSD
Type
Technique and Instrumentation Development
Information
Microscopy and Microanalysis , Volume 22 , Issue 4 , August 2016 , pp. 789 - 802
Copyright
© Microscopy Society of America 2016 

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