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Performance of an Improved TEM SDD Detector

Published online by Cambridge University Press:  27 August 2014

Hendrik O. Colijn ,
Fan Yang ,
D. B. Williams ,
Alan Sandborg  and
David W. McComb
Hendrik O. Colijn
Affiliation:
Center for Microscopy and Analysis, The Ohio State University, Columbus, OH, USA
Fan Yang
Affiliation:
Center for Microscopy and Analysis, The Ohio State University, Columbus, OH, USA
D. B. Williams
Affiliation:
Center for Microscopy and Analysis, The Ohio State University, Columbus, OH, USA
Alan Sandborg
Affiliation:
EDAX, Inc., Mahwah, NJ, USA
David W. McComb
Affiliation:
Center for Microscopy and Analysis, The Ohio State University, Columbus, OH, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 608 - 609
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] von Harrach, H.S., et al, Microscopy & Microanalysis 15, S2, 208 (2009.Google Scholar
[2] Kotula, P.G., Michael, J.R. Microscopy & Microanalysis (2013). 978.Google Scholar
[3] The authors acknowledge support from The Ohio State University and the Ohio Third Frontier Research Scholar program.Google Scholar