Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-26T16:48:17.041Z Has data issue: false hasContentIssue false
  • English
  • Français

Performance and Stability of Dedicated Aberration-Corrected STEMs: a User's Perspective

Published online by Cambridge University Press:  27 August 2014

D.M. Kepaptsoglou ,
A.R. Lupini ,
D. Mücke-Herzberg ,
G. Vaughan  and
Q.M. Ramasse
D.M. Kepaptsoglou
Affiliation:
SuperSTEM Laboratory, STFC Daresbury Campus, Daresbury, United Kingdom
A.R. Lupini
Affiliation:
Materials Science & Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, U.S.A
D. Mücke-Herzberg
Affiliation:
SuperSTEM Laboratory, STFC Daresbury Campus, Daresbury, United Kingdom
G. Vaughan
Affiliation:
SuperSTEM Laboratory, STFC Daresbury Campus, Daresbury, United Kingdom
Q.M. Ramasse
Affiliation:
SuperSTEM Laboratory, STFC Daresbury Campus, Daresbury, United Kingdom

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 924 - 925
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Bell, D. C., Russo, C. J., and Benner, G. Microsc Microanal 16, 386 (2010).Google Scholar
[2] Muller, A. and Grazul, J. J Electron Microsc 50 , 219 (2001).Google Scholar
[3] Muller, D. A., Kirkland, E. J., Thomas, M. G., et al., Ultramicroscopy 106, 1033 (2006).Google Scholar
[4] Barthel, J.and Thust, A. Ultramicroscopy 134, 6 (2013).Google Scholar
[5] SuperSTEM is the UK National Facility of aberration corrected STEM, funded by the EPSRC.Google Scholar