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Performance and Application of an Aberration Corrected Analytical Electron Microscope with a Cold Field Emission Gun

Published online by Cambridge University Press:  08 April 2017

Y Kohno ,
E Okunishi ,
I Ishikawa ,
T Tomita ,
T Kaneyama  and
Y Kondo
Y Kohno
Affiliation:
JEOL Ltd, Japan
E Okunishi
Affiliation:
JEOL Ltd, Japan
I Ishikawa
Affiliation:
JEOL Ltd, Japan
T Tomita
Affiliation:
JEOL Ltd, Japan
T Kaneyama
Affiliation:
JEOL Ltd, Japan
Y Kondo
Affiliation:
JEOL Ltd, Japan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1162 - 1163
Copyright
Copyright © Microscopy Society of America 2011