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Pattern Center Determination in Electron Backscatter Diffraction Microscopy

Published online by Cambridge University Press:  12 May 2011

Jay Basinger ,
David Fullwood ,
Josh Kacher  and
Brent Adams
Jay Basinger*
Affiliation:
1007 E 150 N, Provo, UT 84606, USA Department of Mechanical Engineering, Brigham Young University, 435 Crabtree Building, Provo, UT 84602, USA
David Fullwood
Affiliation:
Department of Mechanical Engineering, Brigham Young University, 435 Crabtree Building, Provo, UT 84602, USA
Josh Kacher
Affiliation:
Materials Science and Engineering, University of Illinois at Urbana-Champaign, 2520B Leeper Drive, Champaign, IL 65822, USA
Brent Adams
Affiliation:
Department of Mechanical Engineering, Brigham Young University, 435 Crabtree Building, Provo, UT 84602, USA
*
Corresponding author. E-mail: [email protected]
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Abstract

The pattern center of an electron backscatter diffraction (EBSD) image indicates the relative position of the image with reference to the interaction volume of the sample. As interest grows in high-resolution EBSD techniques, accurate knowledge of this position is essential for precise interpretation of the EBSD features. In a typical EBSD framework, Kikuchi bands are recorded on a phosphor screen. If the flat phosphor were instead shaped as a sphere, with its center at the specimen's electron interaction volume, then the incident backscattered electrons would form Kikuchi bands on that sphere with parallel band edges centered on great circles. In this article, the authors present a method of pattern center (PC) refinement that maps bands from the planar phosphor onto a virtual spherical screen and measures the deviation of bands from a great circle and from possessing parallel edges. Potential sources of noise and error, as well as methods for reducing these, are discussed. Finally, results are presented on the application of the PC algorithm to two types of simulated EBSD patterns and two experimental setups, and the resolution of the method is discussed.

Keywords

pattern centerEBSDspherical projectionconvolution
Type
Electron Backscatter Diffraction Special Section
Information
Microscopy and Microanalysis , Volume 17 , Issue 3 , June 2011 , pp. 330 - 340
Copyright
Copyright © Microscopy Society of America 2011

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References

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