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Parallel Transmission Electron and Atomic Force Microscopy: Direct and Repetitive Correlation of TEM and AFM images by a Novel Sample Holder

Published online by Cambridge University Press:  01 August 2002

Alvin C. Lin  and
M. Cynthia Goh
Alvin C. Lin
Affiliation:
Department of Chemistry, University of Toronto, Toronto, ON, M5S 3H6
M. Cynthia Goh
Affiliation:
Department of Chemistry, University of Toronto, Toronto, ON, M5S 3H6

Abstract

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Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1026 - 1027
Copyright
Copyright © Microscopy Society of America 2002