Hostname: page-component-5c6d5d7d68-wbk2r Total loading time: 0 Render date: 2024-08-25T10:40:30.789Z Has data issue: false hasContentIssue false
  • English
  • Français

Parallel Acquisition of Real and Reciprocal Space Data in Transmission SEM

Published online by Cambridge University Press:  22 July 2022

Peter Denninger ,
Peter Schweizer  and
Erdmann Spiecker
Peter Denninger*
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) and Center for Nanoanalysis and Electron Microscopy (CENEM), IZNF, Friedrich-Alexander-Universität Erlangen-Nürnberg, Germany
Peter Schweizer
Affiliation:
EMPA, Thun, Switzerland
Erdmann Spiecker*
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) and Center for Nanoanalysis and Electron Microscopy (CENEM), IZNF, Friedrich-Alexander-Universität Erlangen-Nürnberg, Germany
*
*Corresponding authors: [email protected], [email protected]
*Corresponding authors: [email protected], [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advanced Imaging and Spectroscopy for Nanoscale Materials
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2500 - 2503
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Caplins, BW, Holm, JD and Keller, RR, Ultramicroscopy 196 (2019).10.1016/j.ultramic.2018.09.006CrossRefGoogle Scholar
Caplins, BW et al. , Ultramicroscopy 219 (2020).10.1016/j.ultramic.2020.113137CrossRefGoogle Scholar
Holm, JD and Keller, RR, Ultramicroscopy 167 (2016).10.1016/j.ultramic.2016.05.001CrossRefGoogle Scholar
Ophus, C et al. , Microsc. Microanal. 20 (2014).Google Scholar
Schweizer, P et al. , Ultramicroscopy 213 (2020).10.1016/j.ultramic.2020.112956CrossRefGoogle Scholar
Denninger, P et al. , Microscopy and Microanalysis 27(S1) (2021), p. 2696.Google Scholar
Denninger, P et al. , Microscopy and Microanalysis 27(S1) (2021).Google Scholar
The authors acknowledge funding by the German Research Foundation (DFG) via the Research Training Group GRK 1896 “In situ microscopy with electrons, X-rays and Scanning probes”.Google Scholar