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Oxidation of metallic glass thin films: a combined EPMA and XPS investigation into the composition and thickness of oxidized surfaces

Published online by Cambridge University Press:  30 July 2021

William Nachlas ,
Sachin Muley ,
Aurelien Moy ,
John Sunderland ,
John Fournelle  and
Paul Voyles
William Nachlas
Affiliation:
Department of Geoscience, University of Wisconsin-Madison, United States
Sachin Muley
Affiliation:
University of Wisconsin-Madison, United States
Aurelien Moy
Affiliation:
University of Wisconsin-Madison, United States
John Sunderland
Affiliation:
University of Wisconsin-Madison, United States
John Fournelle
Affiliation:
Department of Geoscience, University of Wisconsin-Madison, United States
Paul Voyles
Affiliation:
University of Wisconsin Madison, United States

Abstract

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Type
Many Detectors Make Lights Work: Advances in Microanalysis of Light Elements in Synthetic and Natural Materials
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 3328 - 3330
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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